array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14595" } Experimental study on the reliable working life of PUF chip for 8 years - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

大学 北京工业大学 / 信息学部
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Experimental study on the reliable working life of PUF chip for 8 years

2022
会议 International Conference on Electronic Information Technology (EIT 2022)
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