A current transient method for trap analysis in BiFeO3 thin films - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6228" } A current transient method for trap analysis in BiFeO3 thin films - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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A current transient method for trap analysis in BiFeO3 thin films

2018

期刊 Applied Physics Letters

作者 Hui Zhu · Ying Yang · Xiao Meng · Anquan Jiang · Zilong Bai · Xiang Zheng · Lei Jin · Chen Wang · Shiwei Feng

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卷 112
期 18
页码 182904
AIP Publishing
ISSN: 0003-6951
DOI: 10.1063/1.5025424

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