#Xianwei Meng

Trap Characterization of Trench-Gate SiC MOSFETs based on Transient Drain Current

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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