array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6265" } A Method of Thermal Analysis for CMOS Integrated Circuit - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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A Method of Thermal Analysis for CMOS Integrated Circuit

2006
会议 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings
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