Novel Semiconductor Devices and Reliability Lab

Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors under Reverse Pulse Electrical Stress Using the Voltage-Transient Method

2023

期刊 IEEE Transactions on Device and Materials Reliability

作者 Xiaozhuang Lu · Shiwei Feng · Shijie Pan · Xuan Li · Kun Bai · Hui Zhu

A numerical calibration of structure-function transient thermal measurement based on Cauer RC network

2023

期刊 Microelectronics Journal

作者 Kun Bai · Shiwei Feng · Xuan Li · Shijie Pan · Xiaozhuang Lu · Zhihong Feng · Yamin Zhang

A thermal boundary resistance measurement method based on a designed chip with the heat source separated from the temperature sensor

2023

期刊 Applied Physics Letters

作者 Xuan Li · Shiwei Feng · Zhihong Feng · Shijie Pan · Yuanjie Lv · Kun Bai · Xiaozhuang Lu · Junhua Qin · Yamin Zhang

Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

2023

期刊 IEEE Transactions on Electron Devices

作者 Na Xie · Hui Zhu · Yiqun Zhang · Zeng Huang · Zhixuan Fang · Zheng Liu · Dong Li · Shiwei Feng · Chunsheng Guo · Yamin Zhang · Bo Liu · Lixing Zhou · Xing Liu · Yerong Sun · Zhirang Zhang · Yilin Li · Zhiwen Yao

Measurement Deviation of the Virtual Junction Temperature by the Saturation Voltage Drop Method for Insulated-Gate Bipolar Transistors

2023

期刊 SSRN Electronic Journal

作者 Yumeng Li · Chunsheng Guo · Di Zhao · Shiwei Zhang · Shijie Pan · Hui Zhu · Shiwei Feng

Measuring Double-Sided Thermal Resistance of Press-Pack IGBT Modules Based on Ratio of Double-Sided Heat Dissipation

2023

期刊 IEEE Transactions on Electron Devices

作者 Chunsheng Guo · Shaoxiong Cui · Wenyi Tsai · Yunong Liu · Juewen Ding · Jinyuan Li · Zhongyuan Chen · Yaosheng Li · Shijie Pan · Shiwei Feng

Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection

2023

期刊 IEEE Transactions on Instrumentation and Measurement

作者 Xianwei Meng · Meng Zhang · Kun Duan · Xiang Zheng · Yuwei Zhai · Shiwei Feng · Yamin Zhang

Study of the temperature distribution in insulated gate bipolar transistor module under different test conditions

2023

期刊 Microelectronics Reliability

作者 Di Zhao · Chunsheng Guo · Yumeng Li · Shijie Pan · Shiwei Feng · Hui Zhu

Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method

2023

期刊 Applied Physics Letters

作者 Yilin Li · Hui Zhu · Xing Liu · Xiaolei Wang · Hao Xu · Shijie Pan · Jinjuan Xiang · Lixing Zhou · Zhiwen Yao · Yerong Sun · Shiwei Feng

Trap Characterization of Trench-Gate SiC MOSFETs based on Transient Drain Current

2023

期刊 IEEE Transactions on Power Electronics

作者 Shan Jiang · Meng Zhang · Xianwei Meng · Xiang Zheng · Shiwei Feng · Yamin Zhang

Characterization of hole traps in reverse-biased Schottky-type p-GaN gate HEMTs by current-transient method

2022

期刊 Applied Physics Letters

作者 Shijie Pan · Shiwei Feng · Xuan Li · Kun Bai · Xiaozhuang Lu · Yanjie Li · Yamin Zhang · Lixing Zhou · Meng Zhang

Characterization of traps in GaN-based HEMTs by drain voltage transient and capacitance deep-level transient spectroscopy

2022

期刊 Semiconductor Science and Technology

作者 Shijie Pan · Shiwei Feng · Xuan Li · Kun Bai · Xiaozhuang Lu · Yamin Zhang · Lixing Zhou · Erming Rui · Qiang Jiao · Yu Tian

Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

2022

期刊 IEEE Transactions on Electron Devices

作者 Hui Zhu · Zhixuan Fang · Na Xie · Zeng Huang · Zheng Liu · Dong Li · Shiwei Feng · Chunsheng Guo · Yamin Zhang · Lixing Zhou · Bo Liu

Effect of interface morphology on thermal contact resistance in thermal management of electronic devices

2022

期刊 International Journal of Modern Physics B

作者 Yu-Zheng Chen · Shi-Wei Feng · Ya-Min Zhang · Xin He · Kun Bai · Xuan Li

Experimental investigation on dipole and band offset affected by charge neutrality level modulation

2022

期刊 Applied Physics A

作者 Lixing Zhou · Jinjuan Xiang · Xiaolei Wang · Yamin Zhang · Wenwu Wang · Shiwei Feng

Experimental study on the reliable working life of PUF chip for 8 years

2022

会议 International Conference on Electronic Information Technology (EIT 2022)

作者 Konggang Zhu · Chunsheng Guo · Shiwei Zhang · Hao Li

Identification of Traps in p-GaN Gate HEMTs During OFF-State Stress by Current Transient Method

2022

期刊 IEEE Transactions on Electron Devices

作者 Shijie Pan · Shiwei Feng · Xuan Li · Kun Bai · Xiaozhuang Lu · Jiayu Zhu · Yamin Zhang · Lixing Zhou

Implementation of Fast Measurement System of Semiconductor Device Parameter Temperature Coefficient Based on FPGA

2022

期刊 Journal of Physics: Conference Series

作者 Tianqi Li · Shiwei Feng · Kun Bai · Yijia Ni

Research on temperatures located within facet coating layers along z-axis of semiconductor lasers

2022

期刊 Optics & Laser Technology

作者 Yijia Ni · Shiwei Feng · Xiaozhuang Lu · Kun Bai · Yamin Zhang · Shijie Pan · Xuan Li

Research on transient thermal behavior of semiconductor lasers under pulse current excitation by thermoreflection technique

2022

期刊 Optics Communications

作者 Yijia Ni · Shiwei Feng · Zhihong Feng · Xiaozhuang Lu · Kun Bai

Strain distribution and electrical characteristics of flexible low-temperature polysilicon thin film transistors under biaxial bending

2022

期刊 Journal of Physics: Conference Series

作者 Zhixuan Fang · Zeng Huang · Na Xie · Zheng Liu · Dong Li · Yilin Li · Yerong Sun · Zhiwen Yao

Wake-up effect in Hf0.4Zr0.6O2 ferroelectric thin-film capacitors under a cycling electric field

2022

期刊 Chinese Physics B

作者 Yilin Li · Hui Zhu · Rui Li · Jie Liu · Jinjuan Xiang · Na Xie · Zeng Huang · Zhixuan Fang · Xing Liu · Lixing Zhou

Analysis of the Effects of High-Energy Electron Irradiation of GaN High-Electron-Mobility Transistors Using the Voltage-Transient Method

2021

期刊 IEEE Transactions on Electron Devices

作者 Shijie Pan · Shiwei Feng · Xuan Li · Xiang Zheng · Xiaozhuang Lu · Chaoxu Hu · Guojian Shao · Gang Lin

A new method for detecting heteromorphic workpiece brazing layer quality based on thermal probe

2021

期刊 Review of Scientific Instruments

作者 Chaoxu Hu · Shiwei Feng · Yamin Zhang · Xin He · Kun Bai · Sheng Wang · Shijie Pan

Build-in compact and efficient temperature sensor array on field programmable gate array

2021

期刊 Microelectronics Journal

作者 Sheng Wang · Shiwei Feng · Yuxuan Xiao · Chaoxu Hu · Shijie Pan

Characterization of thermal-resistance in Ga2O3 Schottky barrier diodes with temperature-sensitive electrical parameters

2021

期刊 Semiconductor Science and Technology

作者 Xuan Li · Shiwei Feng · Zhihong Feng · Yuanjie Lv · Yuangang Wang · Xin He · Kun Bai · Shijie Pan

Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET

2021

期刊 Microelectronics Reliability

作者 Kun Bai · Shiwei Feng · Xiang Zheng · Xin He · Shijie Pan · Xuan Li

Effects of gamma irradiation on GaN high-electron-mobility transistors characterized by the voltage-transient method

2021

期刊 Semiconductor Science and Technology

作者 Shijie Pan · Shiwei Feng · Xuan Li · Xiang Zheng · Xiaozhuang Lu · Chaoxu Hu · Xin He · Kun Bai · Lixing Zhou · Yamin Zhang

Effects of temperature and bias voltage on electron transport properties in GaN highelectron-mobility transistors

2021

期刊 IEEE Transactions on Device and Materials Reliability

作者 Shijie Pan · Shiwei Feng · Xiang Zheng · Xin He · Xuan Li · Kun Bai

Identifying the Properties of Traps in GaN High-Electron-Mobility Transistors via Amplitude Analysis Based on the Voltage-Transient Method

2021

期刊 IEEE Transactions on Electron Devices

作者 Shijie Pan · Shiwei Feng · Xuan Li · Xiang Zheng · Xiaozhuang Lu · Xin He · Kun Bai · Yamin Zhang · Lixing Zhou

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Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors under Reverse Pulse Electrical Stress Using the Voltage-Transient Method

A numerical calibration of structure-function transient thermal measurement based on Cauer RC network

A thermal boundary resistance measurement method based on a designed chip with the heat source separated from the temperature sensor

Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Measurement Deviation of the Virtual Junction Temperature by the Saturation Voltage Drop Method for Insulated-Gate Bipolar Transistors

Measuring Double-Sided Thermal Resistance of Press-Pack IGBT Modules Based on Ratio of Double-Sided Heat Dissipation

Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection

Study of the temperature distribution in insulated gate bipolar transistor module under different test conditions

Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method

Trap Characterization of Trench-Gate SiC MOSFETs based on Transient Drain Current

Characterization of hole traps in reverse-biased Schottky-type p-GaN gate HEMTs by current-transient method

Characterization of traps in GaN-based HEMTs by drain voltage transient and capacitance deep-level transient spectroscopy

Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Effect of interface morphology on thermal contact resistance in thermal management of electronic devices

Experimental investigation on dipole and band offset affected by charge neutrality level modulation

Experimental study on the reliable working life of PUF chip for 8 years

Identification of Traps in p-GaN Gate HEMTs During OFF-State Stress by Current Transient Method

Implementation of Fast Measurement System of Semiconductor Device Parameter Temperature Coefficient Based on FPGA

Research on temperatures located within facet coating layers along z-axis of semiconductor lasers

Research on transient thermal behavior of semiconductor lasers under pulse current excitation by thermoreflection technique

Strain distribution and electrical characteristics of flexible low-temperature polysilicon thin film transistors under biaxial bending

Wake-up effect in Hf<sub>0.4</sub>Zr<sub>0.6</sub>O<sub>2</sub> ferroelectric thin-film capacitors under a cycling electric field

Analysis of the Effects of High-Energy Electron Irradiation of GaN High-Electron-Mobility Transistors Using the Voltage-Transient Method

A new method for detecting heteromorphic workpiece brazing layer quality based on thermal probe

Build-in compact and efficient temperature sensor array on field programmable gate array

Characterization of thermal-resistance in Ga2O3 Schottky barrier diodes with temperature-sensitive electrical parameters

Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET

Effects of gamma irradiation on GaN high-electron-mobility transistors characterized by the voltage-transient method

Effects of temperature and bias voltage on electron transport properties in GaN highelectron-mobility transistors

Identifying the Properties of Traps in GaN High-Electron-Mobility Transistors via Amplitude Analysis Based on the Voltage-Transient Method