#Xiaozhuang Lu

Effects of gamma irradiation on GaN high-electron-mobility transistors characterized by the voltage-transient method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Analysis of the Effects of High-Energy Electron Irradiation of GaN High-Electron-Mobility Transistors Using the Voltage-Transient Method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Identifying the Properties of Traps in GaN High-Electron-Mobility Transistors via Amplitude Analysis Based on the Voltage-Transient Method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on transient thermal behavior of semiconductor lasers under pulse current excitation by thermoreflection technique

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Research on temperatures located within facet coating layers along z-axis of semiconductor lasers

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Characterization of traps in GaN-based HEMTs by drain voltage transient and capacitance deep-level transient spectroscopy

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Identification of Traps in p-GaN Gate HEMTs During OFF-State Stress by Current Transient Method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Characterization of hole traps in reverse-biased Schottky-type p-GaN gate HEMTs by current-transient method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors under Reverse Pulse Electrical Stress Using the Voltage-Transient Method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A thermal boundary resistance measurement method based on a designed chip with the heat source separated from the temperature sensor

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

A numerical calibration of structure-function transient thermal measurement based on Cauer RC network

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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