Thermal analysis of ICs based on equivalent thermal resistance - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14592" } Thermal analysis of ICs based on equivalent thermal resistance - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Thermal analysis of ICs based on equivalent thermal resistance

2008

会议 2008 9th International Conference on Solid-State and Integrated-Circuit Technology

作者 Rong Su · Shiwei Feng · Chunsheng Guo · Bin Zhang · Hao Meng · Guangchen Zhang

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IEEE
DOI: 10.1109/icsict.2008.4734562

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