Thermal analysis of ICS based on equivalent thermal resistance and skill language - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14596" } Thermal analysis of ICS based on equivalent thermal resistance and skill language - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

关注

Thermal analysis of ICS based on equivalent thermal resistance and skill language

2009

会议 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

作者 Bin Zhang · Rong Su · Shiwei Feng · Guangchen Zhang · Chunsheng Guo · Yin Liu · Kaikai Ding

下载全文

IEEE
DOI: 10.1109/ipfa.2009.5232590

LabXing 上可以免费创建课题组网站