array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "15260" } Rapid test method for thermal characteristics of semiconductor devices - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

大学 北京工业大学 / 信息学部
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Rapid test method for thermal characteristics of semiconductor devices

2017
会议 2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)
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