Analysis of junction temperatures in high-power GaN-based LEDs - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6284" } Analysis of junction temperatures in high-power GaN-based LEDs - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Analysis of junction temperatures in high-power GaN-based LEDs

2010

期刊 Science China Technological Sciences

作者 Yuxuan Jiang · Zheng Li · Yongjian Sun · Tongjun Yu · Zhizhong Chen · Guoyi Zhang · Guangchen Zhang · Shiwei Feng

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卷 53
期 2
页码 297-300
Springer Science and Business Media LLC
ISSN: 1674-7321
DOI: 10.1007/s11431-010-0040-5

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