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#Zhou Zhou
Quick screen of thermal resistance for batching high brightness LEDs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal Fatigue Characteristics of Die Attach Materials for Packaged High-Brightness LEDs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Evaluation of thermal resistance constitution for packaged AlGaN/GaN high electron mobility transistors by structure function method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Evaluation of VDMOS Storage Failure Rate Based on Accelerated Factor
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal stability evaluation of die attach for high brightness LEDs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学