A Novel Method for Measuring the Temperature in the Active Region of Semiconductor Modules - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6273" } A Novel Method for Measuring the Temperature in the Active Region of Semiconductor Modules - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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A Novel Method for Measuring the Temperature in the Active Region of Semiconductor Modules

2012

期刊 Chinese Physics Letters

作者 Jing Liu · Shi-Wei Feng · Guang-Chen Zhang · Hui Zhu · Chun-Sheng Guo · Yan-Bin Qiao · Jing-Wan Li

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卷 29
期 4
页码 044401
IOP Publishing
ISSN: 0256-307X
DOI: 10.1088/0256-307x/29/4/044401

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