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#Chun-Sheng Guo
All-digital thermal distribution measurement on field programmable gate array using ring oscillators
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
The degradation and recovery properties of AlGaN/GaN high-electron mobility transistors under direct current reverse step voltage stress
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Degradation and recovery property of Schottky Barrier height of AlGaN/GaN high electron mobility transistors under reverse AC electrical stress
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
A Novel Method for Measuring the Temperature in the Active Region of Semiconductor Modules
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Evaluation of thermal resistance constitution for packaged AlGaN/GaN high electron mobility transistors by structure function method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Error Correction of Theory Model in Process-Stress Accelerated Test
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Evaluation of VDMOS Storage Failure Rate Based on Accelerated Factor
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Channel Temperature Measurement of AlGaN/GaN HEMTs by Forward Schottky Characteristics
Novel Semiconductor Devices and Reliability Lab , 北京工业大学